TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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TC74VCX2125FT/FK
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74VCX2125FT,TC74VCX2125FK
Low Voltage Quad Bus Buffer with 3.6-V Tolerant Inputs and Outputs
The TC74VCX2125FT/FK is a high-performance CMOS quad
bus buffer. Designed for use in 1.8-V, 2.5-V or 3.3-V systems, it
achieves high-speed operation while maintaining the CMOS low
power dissipation.
It is also designed with overvoltage tolerant inputs and outputs
up to 3.6 V.
This device requires the 3-state control input OE to be set
high to place the output into the high-impedance state.
The 26--series resistor helps reducing output overshoot and
undershoot without external resistor.
All inputs are equipped with protection circuits against static
discharge.
TC74VCX2125FT
TC74VCX2125FK
Features
26--series resistos on outputs.
Low-voltage operation: VCC = 1.8 to 3.6 V
High-speed operation: tpd = 3.7 ns (max) (VCC = 3.0 to 3.6 V)
: tpd = 4.8 ns (max) (VCC = 2.3 to 2.7 V)
: tpd = 9.6 ns (max) (VCC = 1.8 V)
Output current: IOH/IOL = ±12 mA (min) (VCC = 3.0 V)
: IOH/IOL = ±8 mA (min) (VCC = 2.3 V)
Weight
TSSOP14-P-0044-0.65A
VSSOP14-P-0030-0.50
: IOH/IOL = ±4 mA (min) (VCC = 1.8 V)
Latch-up performance: 300 mA
ESD performance: Machine model ≥ ±200 V
Human body model ≥ ±2000 V
Package: TSSOP and VSSOP (US)
3.6-V tolerant function and power-down protection provided on all inputs and outputs
: 0.06 g (typ.)
: 0.02 g (typ.)
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2007-10-19


TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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Pin Assignment (top view)
1OE 1
1A 2
1Y 3
2OE 4
2A 5
2Y 6
GND 7
14 VCC
13 4OE
12 4A
11 4Y
10 3OE
9 3A
8 3Y
TC74VCX2125FT/FK
IEC Logic Symbol
1OE
1A
2OE
2A
3OE
3A
4OE
4A
1
2
4
5
10
9
13
12
EN
3 1Y
6 2Y
8 3Y
11 4Y
Truth Table
Inputs
OE
H
L
L
A
X
L
H
X: Don’t care
Z: High impedance
Outputs
Y
Z
L
H
Absolute Maximum Ratings (Note 1)
Characteristics
Power supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
Power dissipation
DC VCC/ground current
Storage temperature
Symbol
VCC
VIN
VOUT
IIK
IOK
IOUT
PD
ICC/IGND
Tstg
Rating
0.5 to 4.6
0.5 to 4.6
0.5 to 4.6 (Note 2)
0.5 to VCC + 0.5
(Note 3)
50
±50 (Note 4)
±50
180
±100
65 to 150
Unit
V
V
V
mA
mA
mA
mW
mA
°C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
www.DataSheet4U.Pcolemase design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: OFF state
Note 3: High or low state. IOUT absolute maximum rating must be observed.
Note 4: VOUT < GND, VOUT > VCC
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TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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Operating Ranges (Note 1)
TC74VCX2125FT/FK
Characteristics
Symbol
Rating
Unit
Power supply voltage
Input voltage
Output voltage
Output current
Operating temperature
Input rise and fall time
VCC
VIN
VOUT
IOH/IOL
Topr
dt/dv
1.8 to 3.6
1.2 to 3.6 (Note 2)
0.3 to 3.6
0 to 3.6 (Note 3)
0 to VCC (Note 4)
±12 (Note 5)
±8 (Note 6)
±4 (Note 7)
40 to 85
0 to 10 (Note 8)
V
V
V
mA
°C
ns/V
Note 1: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 2: Data retention only
Note 3: OFF state
Note 4: High or low state
Note 5: VCC = 3.0 to 3.6 V
Note 6: VCC = 2.3 to 2.7 V
Note 7: VCC = 1.8 V
Note 8: VIN = 0.8 to 2.0 V, VCC = 3.0 V
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TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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Electrical Characteristics
DC Characteristics (Ta = −40 to 85°C, 2.7 V < VCC =< 3.6 V)
Characteristics
Symbol
Test Condition
Input voltage
H-level
L-level
H-level
Output voltage
L-level
Input leakage current
3-state output OFF state current
Power-off leakage current
Quiescent supply current
Increase in ICC per input
VIH
VIL
IOH = −100 μA
VOH
VOL
IIN
IOZ
IOFF
ICC
ΔICC
VIN = VIH or VIL
IOH = −6 mA
IOH = −8 mA
IOH = −12 mA
IOL = 100 μA
VIN = VIH or VIL
IOL = 6 mA
IOL = 8 mA
IOL = 12 mA
VIN = 0 to 3.6 V
VIN = VIH or VIL
VOUT = 0 to 3.6 V
VIN, VOUT = 0 to 3.6 V
VIN = VCC or GND
VCC <= (VIN, VOUT) <= 3.6 V
VIH = VCC 0.6 V
DC Characteristics (Ta = −40 to 85°C, 2.3 V =< VCC =< 2.7 V)
Characteristics
Symbol
Test Condition
Input voltage
H-level
L-level
Output voltage
H-level
L-level
Input leakage current
3-state output OFF state current
www.DataPSohweeert-4oUff.lceoamkage current
Quiescent supply current
VIH
VIL
VOH
VOL
IIN
IOZ
IOFF
ICC
IOH = −100 μA
VIN = VIH or VIL
IOH = −4 mA
IOH = −6 mA
IOH = −8 mA
IOL = 100 μA
VIN = VIH or VIL
IOL = 6 mA
IOL = 8 mA
VIN = 0 to 3.6 V
VIN = VIH or VIL
VOUT = 0 to 3.6 V
VIN, VOUT = 0 to 3.6 V
VIN = VCC or GND
VCC <= (VIN, VOUT) <= 3.6 V
TC74VCX2125FT/FK
VCC (V)
2.7 to 3.6
Min
2.0
2.7 to 3.6
2.7 to 3.6
VCC
0.2
2.7 2.2
3.0 2.4
3.0 2.2
2.7 to 3.6
2.7
3.0
3.0
2.7 to 3.6
Max
0.8
0.2
0.4
0.55
0.8
±5.0
Unit
V
V
μA
2.7 to 3.6 ⎯ ±10.0 μA
0
2.7 to 3.6
2.7 to 3.6
2.7 to 3.6
10.0
20.0
±20.0
750
μA
μA
VCC (V)
2.3 to 2.7
Min
1.6
2.3 to 2.7
2.3 to 2.7
VCC
0.2
2.3 2.0
2.3 1.8
2.3 1.7
2.3 to 2.7
2.3
2.3
2.3 to 2.7
Max
0.7
0.2
0.4
0.6
±5.0
Unit
V
V
μA
2.3 to 2.7 ⎯ ±10.0 μA
0
2.3 to 2.7
2.3 to 2.7
10.0
20.0
±20.0
μA
μA
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TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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DC Characteristics (Ta = −40 to 85°C, 1.8 V =< VCC < 2.3 V)
TC74VCX2125FT/FK
Characteristics
Symbol
Test Condition
Input voltage
H-level
L-level
VIH
VIL
Output voltage
H-level
L-level
Input leakage current
3-state output OFF state current
Power-off leakage current
Quiescent supply current
VOH
VOL
IIN
IOZ
IOFF
ICC
VIN = VIH or VIL
IOH = −100 μA
IOH = −4 mA
VIN = VIH or VIL
IOL = 100 μA
IOL = 4 mA
VIN = 0 to 3.6 V
VIN = VIH or VIL
VOUT = 0 to 3.6 V
VIN, VOUT = 0 to 3.6 V
VIN = VCC or GND
VCC <= (VIN, VOUT) <= 3.6 V
VCC (V)
1.8 to 2.3
Min
0.7 ×
VCC
1.8 to 2.3
1.8
VCC
0.2
1.8 1.4
1.8
1.8
1.8
Max
0.2 ×
VCC
0.2
0.3
±5.0
Unit
V
V
μA
1.8 ⎯ ±10.0 μA
0 10.0 μA
1.8 20.0
μA
1.8 ⎯ ±20.0
AC Characteristics (Ta = −40 to 85°C, input: tr = tf = 2.0 ns, CL = 30 pF, RL = 500 Ω) (Note 1)
Characteristics
Propagation delay time
3-state output enable time
3-state output disable time
Output to output skew
Symbol
Test Condition
tpLH Figure 1, Figure 2
tpHL
tpZL
tPZH
Figure 1, Figure 3
tpLZ
tpHZ
Figure 1, Figure 3
tosLH
tosHL
Min
VCC (V)
Max
Unit
1.8 1.0 9.6
2.5 ± 0.2 0.8 4.8 ns
3.3 ± 0.3 0.6
3.7
1.8 1.0 9.8
2.5 ± 0.2 0.8 5.1 ns
3.3 ± 0.3 0.6
4.1
1.8 1.0 8.1
2.5 ± 0.2 0.8 4.5 ns
3.3 ± 0.3 0.6
4.1
1.8 0.5
(Note 2) 2.5 ± 0.2 0.5 ns
3.3 ± 0.3
0.5
Note 1: For CL = 50 pF, add approximately 300 ps to the AC maximum specification.
Note 2: Parameter guaranteed by design.
(tosLH = |tpLHm tpLHn|, tosHL = |tpHLm tpHLn|)
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TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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TC74VCX2125FT/FK
Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.0 ns, CL = 30 pF)
Characteristics
Symbol
Test Condition
Quiet output maximum dynamic VOL
Quiet output minimum dynamic VOL
Quiet output minimum dynamic VOH
VOLP
VOLV
VOHV
VIH = 1.8 V, VIL = 0 V
VIH = 2.5 V, VIL = 0 V
VIH = 3.3 V, VIL = 0 V
VIH = 1.8 V, VIL = 0 V
VIH = 2.5 V, VIL = 0 V
VIH = 3.3 V, VIL = 0 V
VIH = 1.8 V, VIL = 0 V
VIH = 2.5 V, VIL = 0 V
VIH = 3.3 V, VIL = 0 V
Note: Parameter guaranteed by design.
Capacitive Characteristics (Ta = 25°C)
(Note)
VCC (V)
1.8
Typ.
0.15
(Note) 2.5 0.25
(Note) 3.3 0.35
(Note) 1.8 0.15
(Note) 2.5 0.25
(Note) 3.3 0.35
(Note) 1.8 1.55
(Note) 2.5 2.05
(Note) 3.3 2.65
Unit
V
V
V
Characteristics
Input capacitance
Output capacitance
Power dissipation capacitance
Symbol
Test Condition
CIN
COUT
CPD
fIN = 10 MHz
VCC (V)
Typ. Unit
1.8, 2.5, 3.3
6
pF
1.8, 2.5, 3.3
7
pF
(Note) 1.8, 2.5, 3.3 20
pF
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPDVCCfIN + ICC/4 (per bit)
AC Test Circuit
Switch
Output
6.0 V or VCC × 2
Open
GND
Measure
CL = 30 pF
RL = 500 Ω
Parameter
tpLH, tpHL
tpLZ, tpZL
tpHZ, tpZH
Switch
6.0 V
VCC × 2
Open
@VCC = 3.3 ± 0.3 V
@VCC = 2.5 ± 0.2 V
@VCC = 1.8 V
GND
Figure 1
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TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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AC Waveform
Input
(A)
Output
(Y)
tr 2.0 ns
tf 2.0 ns
90%
VM
10%
tpLH
VM
tpHL
Figure 2 tpLH, tpHL
TC74VCX2125FT/FK
VIH
GND
VOH
VOL
Output Enable
Control ( OE )
Output (Y)
Low to Off to Low
Output (Y)
High to Off to High
tr 2.0 ns
tpLZ
tf 2.0 ns
90%
VM
10%
tpZL
tpHZ
VX
VY
tpZH
Outputs
enabled
Outputs
disabled
VM
VM
Outputs
enabled
VIH
GND
3.0 V or VCC
VOL
VOH
GND
Figure 3 tpLZ, tpHZ, tpZL, tpZH
Symbol
VIH
VM
VX
VY
3.3 ± 0.3 V
2.7 V
1.5 V
VOL + 0.3 V
VOH 0.3 V
VCC
2.5 ± 0.2 V
VCC
VCC/2
VOL + 0.15 V
VOH 0.15 V
1.8 V
VCC
VCC/2
VOL + 0.15 V
VOH 0.15 V
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Low Voltage Quad Bus Buffer

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Package Dimensions
TC74VCX2125FT/FK
Weight: 0.06 g (typ.)
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Low Voltage Quad Bus Buffer

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Package Dimensions
TC74VCX2125FT/FK
Weight: 0.02 g (typ.)
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2007-10-19


TC74VCX2125FK (Toshiba Semiconductor)
Low Voltage Quad Bus Buffer

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TC74VCX2125FT/FK
RESTRICTIONS ON PRODUCT USE
The information contained herein is subject to change without notice.
20070701-EN GENERAL
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
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Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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