512Kx8 Plastic Monolithic SRAM CMOS
512Kx8 bit CMOS Static
Random Access Memory
• Access Times of 17, 20, 25ns
• Data Retention Function (LPA version)
• Extended Temperature Testing
• Data Retention Functionality Testing
36 lead JEDEC Approved Revolutionary Pinout
• Plastic SOJ (Package 319)
Single +5V (±10%) Supply Operation
WEDC's ruggedized plastic 512Kx8 SRAM that allows the user to
capitalize on the cost advantage of using a plastic component while
not sacriﬁcing all of the reliability available in a full military device.
Extended temperature testing is performed with the test patterns
developed for use on WEDC’s fully compliant 512Kx8 SRAMs.
WEDC fully characterizes devices to determine the proper test
patterns for testing at temperature extremes. This is critical because
the operating characteristics of device change when it is operated
beyond the commercial guarantee a device that operates reliably
in the ﬁeld at temperature extremes. Users of WEDC’s ruggedized
plastic beneﬁt from WEDC’s extensive experience in characterizing
SRAMs for use in military systems.
WEDC ensures Low Power devices will retain data in Data
Retention mode by characterizing the devices to determine the
appropriate test conditions. This is crucial for systems operating
at -40°C or below and using dense memories such as 512Kx8s.
WEDC’s ruggedized plastic SOJ is footprint compatible with
WEDC’s full military ceramic 36 pin SOJ.
FIGURE 1 – PIN CONFIGURATION
Microsemi Corporation reserves the right to change products or speciﬁcations without notice.
May 2014 © 2014 Microsemi Corporation. All rights reserved.
Power (+5V ±10%)
Microsemi Corporation • (602) 437-1520 • www.microsemi.com/pmgp