2-and 4-Channel Low Capacitancewww.DataSheet4U.com
ESD Protection Arrays
• Two and four channels of ESD protection
• Provides ESD protection to IEC61000-4-2
• ±8kV contact discharge
• Low loading capacitance of 2.0pF max.
• Low clamping voltage
• Channel I/O to I/O capacitance 1.5pF typical
• Zener diode protects supply rail and eliminates
the need for external by-pass capacitors
• Each I/O pin can withstand over 1000 ESD
• Available in RoHS-compliant, lead-free SOT and
• DVI ports, HDMI ports in notebooks, set top
boxes, digital TVs, LCD displays
• Serial ATA ports in desktop PCs and hard disk
• PCI Express ports
• General purpose high-speed data line ESD
The CM1293A family of diode arrays has been
designed to provide ESD protection for electronic
components or subsystems requiring minimal
capacitive loading. These devices are ideal for
protecting systems with high data and clock rates or
for circuits requiring low capacitive loading. Each
ESD channel consists of a pair of diodes in series
that steer the positive or negative ESD current pulse
to either the positive (VP) or negative (VN) supply rail.
A Zener diode is embedded between VP and VN which
helps protect the VCC rail against ESD strikes. The
CM1293A protects against ESD pulses up to ±8kV
contact discharge) per the IEC 61000-4-2 Level 4
This device is particularly well-suited for protecting
systems using high-speed ports such as USB2.0,
IEEE1394 (Firewire®, iLink™), Serial ATA, DVI,
HDMI, and corresponding ports in removable
storage, digital camcorders, DVD-RW drives and
other applications where extremely low loading
capacitance with ESD protection are required in a
small package footprint.
The CM1293A family of devices is available with
RoHS-compliant, lead-free finishing.
*Standard test condition is IEC61000-4-2 level 4 test circuit with each pin subjected to ±8kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one
continuous test run. The part is then subjected to standard production test to verify that all of the tested parameters are within spec after the 1000 strikes.
©2010 SCILLC. All rights reserved.
April 2010 – Rev. 4
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