CAT25640 Datasheet PDF - ON Semiconductor


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CAT25640
ON Semiconductor

Part Number CAT25640
Description 64-Kb SPI Serial CMOS EEPROM
Page 19 Pages

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CAT25640
64-Kb SPI Serial CMOS
EEPROM
Description
The CAT25640 is a 64Kb Serial CMOS EEPROM device
internally organized as 8Kx8 bits. This features a 64byte page write
buffer and supports the Serial Peripheral Interface (SPI) protocol. The
device is enabled through a Chip Select (CS) input. In addition, the
required bus signals are clock input (SCK), data input (SI) and data
output (SO) lines. The HOLD input may be used to pause any serial
communication with the CAT25640 device. The device features
software and hardware write protection, including partial as well as
full array protection.
Features
20 MHz (5 V) SPI Compatible
1.8 V to 5.5 V Supply Voltage Range
SPI Modes (0,0) & (1,1)
64byte Page Write Buffer
Selftimed Write Cycle
Hardware and Software Protection
Block Write Protection
Protect 1/4, 1/2 or Entire EEPROM Array
Low Power CMOS Technology
1,000,000 Program/Erase Cycles
100 Year Data Retention
Industrial and Extended Temperature Range
PDIP, SOIC, TSSOP 8lead, TDFN and UDFN 8pad Packages
This Device is PbFree, Halogen Free/BFR Free, and RoHS
Compliant
VCC
SI
CS
WP
HOLD
SCK
CAT25640
SO
VSS
Figure 1. Functional Symbol
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SOIC8
V SUFFIX
CASE 751BD
UDFN8*
HU3 SUFFIX
CASE 517AX
TDFN8*
VP2 SUFFIX
CASE 511AK
PDIP8
L SUFFIX
CASE 646AA
UDFN8
HU4 SUFFIX
CASE 517AZ
TSSOP8
Y SUFFIX
CASE 948AL
PIN CONFIGURATION
CS 1
SO
VCC
HOLD
WP SCK
VSS SI
PDIP (L), SOIC (V), TSSOP (Y),
TDFN* (VP2), UDFN* (HU3), UDFN (HU4)
* Not recommended for new designs
Pin Name
CS
SO
WP
VSS
SI
SCK
HOLD
VCC
PIN FUNCTION
Function
Chip Select
Serial Data Output
Write Protect
Ground
Serial Data Input
Serial Clock
Hold Transmission Input
Power Supply
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 19 of this data sheet.
© Semiconductor Components Industries, LLC, 2012
May, 2012 Rev. 10
1
Publication Order Number:
CAT25640/D



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CAT25640
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Operating Temperature
45 to +130
°C
Storage Temperature
65 to +150
°C
Voltage on any Pin with Respect to Ground (Note 1)
0.5 to +6.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than 0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than 1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
Min Units
NEND (Note 3) Endurance
1,000,000
Program / Erase Cycles
TDR Data Retention
100 Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C.
Table 3. D.C. OPERATING CHARACTERISTICS
(VCC = 1.8 V to 5.5 V, TA = 40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = 40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min Max
ICCR
Supply Current
(Read Mode)
Read, VCC = 5.5 V,
SO open
10 MHz / 40°C to 85°C
5 MHz / 40°C to 125°C
2
2
ICCW
Supply Current
(Write Mode)
Write, VCC = 5.5 V,
SO open
10 MHz / 40°C to 85°C
5 MHz / 40°C to 125°C
3
3
ISB1
ISB2
IL
ILO
VIL
VIH
VOL1
VOH1
VOL2
VOH2
Standby Current
Standby Current
Input Leakage Current
Output Leakage
Current
VIN = GND or VCC, CS = VCC,
WP = VCC, VCC = 5.5 V
VIN = GND or VCC, CS = VCC,
WP = GND, VCC = 5.5 V
VIN = GND or VCC
CS = VCC,
VOUT = GND or VCC
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
VCC 2.5 V, IOL = 3.0 mA
VCC 2.5 V, IOH = 1.6 mA
VCC < 2.5 V, IOL = 150 mA
VCC < 2.5 V, IOH = 100 mA
TA = 40°C to +85°C
TA = 40°C to +125°C
TA = 40°C to +85°C
TA = 40°C to +125°C
TA = 40°C to +85°C
TA = 40°C to +125°C
2
1
1
0.5
0.7 VCC
VCC 0.8 V
VCC 0.2 V
1
2
3
5
2
1
2
0.3 VCC
VCC + 0.5
0.4
0.2
Units
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
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CAT25640
Table 4. D.C. OPERATING CHARACTERISTICS NEW PRODUCT (Rev F)
(VCC = 1.8 V to 5.5 V, TA = 40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = 40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min Max
ICCR
Supply Current
(Read Mode)
ICCW
Supply Current
(Write Mode)
Read, SO open /
40°C to +85°C
Read, SO open /
40°C to +125°C
Write, CS = VCC/
40°C to +85°C
Write, CS = VCC/
40°C to +125°C
VCC = 1.8 V, fSCK = 5 MHz
VCC = 2.5 V, fSCK =10 MHz
VCC = 5.5 V, fSCK = 20 MHz
2.5 V< VCC < 5.5 V,
fSCK = 10 MHz
VCC = 1.8 V
VCC = 2.5 V
VCC = 5.5 V
2.5 V< VCC < 5.5 V
0.2
0.3
0.6
0.6
0.8
1.4
2
2
ISB1
ISB2
IL
ILO
VIL
VIH
VOL1
VOH1
VOL2
VOH2
Standby Current
Standby Current
Input Leakage Current
Output Leakage
Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
VIN = GND or VCC,
CS = VCC, WP = VCC,
VCC = 5.5 V
VIN = GND or VCC,
CS = VCC, WP = GND,
VCC = 5.5 V
VIN = GND or VCC
CS = VCC
VOUT = GND or VCC
TA = 40°C to +85°C
TA = 40°C to +125°C
TA = 40°C to +85°C
TA = 40°C to +125°C
TA = 40°C to +85°C
TA = 40°C to +125°C
VCC > 2.5 V, IOL = 3.0 mA
VCC > 2.5 V, IOH = 1.6 mA
VCC < 2.5 V, IOL = 150 mA
VCC < 2.5 V, IOH = 100 mA
2
1
1
0.5
0.7 VCC
VCC 0.8 V
VCC 0.2 V
1
3
3
5
2
1
2
0.3 VCC
VCC + 0.5
0.4
0.2
Units
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
Table 5. PIN CAPACITANCE (Note 4) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V)
Symbol
Test
Conditions
Min Typ Max Units
COUT
Output Capacitance (SO)
VOUT = 0 V
8 pF
CIN Input Capacitance (CS, SCK, SI, WP, HOLD)
VIN = 0 V
8 pF
4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100
and JEDEC test methods.
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CAT25640
Table 6. A.C. CHARACTERISTICS MATURE PRODUCT
(TA = 40°C to +85°C (Industrial) and TA = 40°C to +125°C (Extended).) (Notes 5, 8)
VCC = 1.8 V 5.5 V / 405C to +855C
VCC = 2.5 V 5.5 V / 405C to +1255C
VCC = 2.5 V 5.5 V
405C to +855C
Symbol
Parameter
Min Max Min Max Units
fSCK
Clock Frequency
DC 5 DC 10 MHz
tSU Data Setup Time
40
20 ns
tH Data Hold Time
40
20 ns
tWH SCK High Time
75
40 ns
tWL SCK Low Time
75
40 ns
tLZ HOLD to Output Low Z
50 25 ns
tRI (Note 6)
Input Rise Time
2 2 ms
tFI (Note 6)
Input Fall Time
2 2 ms
tHD HOLD Setup Time
0
0 ns
tCD HOLD Hold Time
10
10 ns
tV Output Valid from Clock Low
75 40 ns
tHO Output Hold Time
0
0 ns
tDIS Output Disable Time
50 20 ns
tHZ HOLD to Output High Z
100 25 ns
tCS CS High Time
50
20 ns
tCSS
CS Setup Time
20
15 ns
tCSH (Note 8)
CS Hold Time
30
20 ns
tCNS
CS Interactive Setup Time
20
15 ns
tCNH
CS Interactive Hold Time
20
15 ns
tWPS
WP Setup Time
10
10 ns
tWPH
WP Hold Time
100
60 ns
tWC (Note 7)
Write Cycle Time
5 5 ms
5. AC Test Conditions:
Input Pulse Voltages: 0.3 VCC to 0.7 VCC
Input rise and fall times: 10 ns
Input and output reference voltages: 0.5 VCC
Output load: current source IOL max/IOH max; CL = 50 pF
6. This parameter is tested initially and after a design or process change that affects the parameter.
7. tWC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
8. All Chip Select (CS) timing parameters are defined relative to the positive clock edge (Figure 2). tCSH timing specification is valid
for die revision E and higher. The die revision E is identified by letter “E” or a dedicated marking code on top of the package. For
previous product revision (Rev. D) the tCSH is defined relative to the negative clock edge.
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